TY  - JOUR
U1  - Zeitschriftenartikel, wissenschaftlich - begutachtet (reviewed)
A1  - Sprunck, Sebastian
A1  - Lottis, Christian
A1  - Schnabel, Fabian
A1  - Jung, Marco
T1  - Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors
JF  - IEEE Open Journal of Power Electronics
N2  - This paper investigates the impact of current sensors on the measurement of transient currents in fast-switching power semiconductors in a double pulse test (DPT environment. We review previous research that assesses the influence of current sensors on a DPT circuit through mathematical modeling. The developed selection aids can be used to identify suitable current sensors for transient current measurements of fast-switching power semiconductors and to estimate the error introduced by their insertion into the DPT circuit. Afterwards, this analysis is extended by including further elements from real DPT applications to increase the consistency of the error estimation with practical situations and setups. Both methods are compared and their individual advantages and drawbacks are discussed. Finally, a recommendation on when to use which method is derived.
KW  - wide band gap
KW  - Current measurement
KW  - error analysis
KW  - measurement errors
KW  - sensor phenomena and characterization
KW  - power semiconductors
KW  - double pulse test
UN  - https://nbn-resolving.org/urn:nbn:de:hbz:1044-opus-60077
SN  - 2644-1314
SS  - 2644-1314
U6  - https://doi.org/10.1109/OJPEL.2021.3127225
DO  - https://doi.org/10.1109/OJPEL.2021.3127225
VL  - 2
SP  - 570
EP  - 581
PB  - IEEE
ER  -