TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Mulpuri, Sai Krishna
A1  - Sah, Bikash
A1  - Kumar, Praveen
T1  - The Impact of Relaxation Time on Cell Degradation across the Life Cycle under diverse operating temperatures
T2  - 2024 IEEE Transportation Electrification Conference and Expo (ITEC), 19-21 June 2024, Chicago, IL, USA
SN  - 979-8-3503-1766-4
SB  - 979-8-3503-1766-4
U6  - https://doi.org/10.1109/ITEC60657.2024.10598862
DO  - https://doi.org/10.1109/ITEC60657.2024.10598862
SP  - 1
EP  - 6
S1  - 6
PB  - IEEE
ER  -