TY - JOUR U1 - Zeitschriftenartikel, wissenschaftlich - begutachtet (reviewed) A1 - Gonschor, Derk A1 - Steffen, Jonas A1 - Montoya Perez, Juan Alvaro A1 - Bendfeld, Christian A1 - Naundorf, Detlef A1 - Kost, Philipp A1 - Aigner, Christian A1 - Füllgraf, Florian A1 - Brandl, Ron A1 - Jung, Marco T1 - Digital Twin Development of a Testing Grid using a Grid Analyzer JF - IEEE Open Journal of Power Electronics N2 - The recent transformation of the energy sector brings new challenges in areas such as supply security, efficiency, and reliability. Especially the increase of decentralized power plants leads to a more complex energy system and an increasing complexity. This requires expansion and digitization of the power grid as well as an initiative-taking operation of the grid operator. To investigate such complex systems and its phenomena, modern development methods such as real-time simulation or digital twins (DT) can be used. In this approach a digital replica of the real-world system, a grid section, is developed, which can represent or predict the behavior of the real distribution grid. For this, a model of the real-world system is derived and implemented in a co-simulation environment, in which it receives data via an analyzer or measurement system from the grid model. This paper focuses on the development of the digital twin of a testing grid and a grid analyzer for the measurement. With the digital twin of the testing grid, a first approach is achieved in a real-time capable environment showing the functionalities and interactions of a digital twin. Subsequently the development of the digital twin model is explained, and the results are discussed. KW - Real time systems KW - Power system simulation KW - Digital Twin KW - Power system state estimation KW - Signal analysis,Power system measurements UN - https://nbn-resolving.org/urn:nbn:de:hbz:1044-opus-85401 SN - 2644-1314 SS - 2644-1314 U6 - https://doi.org/10.1109/OJPEL.2024.3436510 DO - https://doi.org/10.1109/OJPEL.2024.3436510 VL - 5 SP - 1197 EP - 1208 PB - IEEE ER -