TY - JOUR U1 - Zeitschriftenartikel, wissenschaftlich - begutachtet (reviewed) A1 - Ellingen, Elias A1 - Rohde, Markus A1 - Stahl, Bastian A1 - Lange, Robert T1 - Fourier scatterometry for compensation of tilt and curvature deviations of two-photon polymerization three-dimensional printers JF - Journal of Optical Microsystems N2 - A Fourier scatterometry setup is evaluated to recover the key parameters of optical phase gratings. Based on these parameters, systematic errors in the printing process of two-photon polymerization (TPP) gray-scale lithography three-dimensional printers can be compensated, namely tilt and curvature deviations. The proposed setup is significantly cheaper than a confocal microscope, which is usually used to determine calibration parameters for compensation of the TPP printing process. The grating parameters recovered this way are compared to those obtained with a confocal microscope. A clear correlation between confocal and scatterometric measurements is first shown for structures containing either tilt or curvature. The correlation is also shown for structures containing a mixture of tilt and curvature errors (squared Pearson coefficient r2 = 0.92). This compensation method is demonstrated on a TPP printer: a diffractive optical element printed with correction parameters obtained from Fourier scatterometry shows a significant reduction in noise as compared to the uncompensated system. This verifies the successful reduction of tilt and curvature errors. Further improvements of the method are proposed, which may enable the measurements to become more precise than confocal measurements in the future, since scatterometry is not affected by the diffraction limit. KW - Fourier scatterometry KW - grating reconstruction KW - transmission phase gratings KW - two-photon polymerization UN - https://nbn-resolving.org/urn:nbn:de:hbz:1044-opus-76295 SN - 2708-5260 SS - 2708-5260 U6 - https://doi.org/10.1117/1.JOM.3.4.043501 DO - https://doi.org/10.1117/1.JOM.3.4.043501 VL - 3 IS - 4 SP - 12 S1 - 12 PB - SPIE ER -