TY  - JOUR
U1  - Zeitschriftenartikel, wissenschaftlich - begutachtet (reviewed)
A1  - Draber, Silke
T1  - Optimizing fault tolerance in embedded distributed systems
JF  - IEEE Micro
KW  - distributed embedded computing system
KW  - system lay-out
KW  - dependability analysis
KW  - project-specific cost profile
KW  - switchgear station
KW  - cost optimization
KW  - redundancy
Y1  - 2000
SN  - 0272-1732
SS  - 0272-1732
U6  - https://doi.org/10.1109/40.865869
DO  - https://doi.org/10.1109/40.865869
VL  - 20
IS  - 4
SP  - 76
EP  - 84
PB  - IEEE
ER  -