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Machine Learning-Based Hard/Soft Logic Trade-offs in VTR

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Metadaten
Document Type:Conference Object
Language:English
Author:Ritwik Sinha, Seyed Alireza Damghani, Kenneth B. Kent
Parent Title (English):2022 IEEE International Workshop on Rapid System Prototyping (RSP), 13 October 2022, Shanghai, China
Pagenumber:7
First Page:57
Last Page:63
ISBN:979-8-3503-9851-9
DOI:https://doi.org/10.1109/RSP57251.2022.10039002
Publisher:IEEE
Date of first publication:2023/02/13
Copyright:©2022 IEEE
Departments, institutes and facilities:Fachbereich Informatik
Dewey Decimal Classification (DDC):0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 004 Datenverarbeitung; Informatik
Entry in this database:2023/03/02