Volltext-Downloads (blau) und Frontdoor-Views (grau)

A Lifetime Consumption Model for Combined Creep and Fatigue Loading of Aluminum Bonding Wires

  • (1) Aluminum bonding wires are mostly used for electrical contact and transmission of electrical signals in power electronic modules. Combined cyclical mechanical and thermal loads acting on the wires can lead to premature failure of the whole module. For this purpose, based on extensive fatigue tests on a 300 µm Al-Pure wire, the authors developed, calibrated and applied a fatigue life model for a cycle range of 𝑅=0.1 to 𝑅=0.7 to other comparable aluminum wires in two previous publications. (2) Since the model is supposed to be used in an FEM post-processor for predicting the lifetime of wire bridges, the existing model was expanded in the following work. (3) Temperature dependence is included in the fatigue model, and it is made more robust in the whole possible R-range to be able to cope with the highly variable load cases in real components. In addition, a creep rupture model was developed and combined with the fatigue model by linear damage accumulation. (4) The applicability of the lifetime consumption model is demonstrated for several combined load cases. It is shown that it is necessary to consider both fatigue and creep in a combined model for a reliable lifetime prediction. Otherwise, the lifetime could be underestimated by several orders of magnitude, depending on the load case.

Download files

Export metadata

Additional Services

Search Google Scholar Check availability

Statistics

Show usage statistics
Metadaten
Document Type:Article
Language:English
Author:Holm AltenbachORCiD, Cassandra MoersORCiD, Christian DresbachORCiD
Parent Title (English):Applied Sciences
Volume:16
Issue:12
Article Number:6058
Number of pages:20
ISSN:2076-3417
URN:urn:nbn:de:hbz:1044-opus-96970
DOI:https://doi.org/10.3390/app16126058
Publisher:MDPI
Place of publication:Basel, Switzerland
Publishing Institution:Hochschule Bonn-Rhein-Sieg
Date of first publication:2026/06/15
License/ Rightsstatement:© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license
Funding:This research was partially funded by the German Federal Ministry of Education and Research in the project WireLife in the program FH-Kooperativ under the funding code 13FH544KX0 and by the University of Applied Sciences Bonn-Rhein-Sieg and the Institute of Technology, Resource and Energy-Efficient Engineering.
Tag:R-ratio; aluminum bonding wire; creep rupture; lifetime prediction; power electronics; small-scale fatigue testing
Departments, institutes and facilities:Fachbereich Angewandte Naturwissenschaften
Institut für Technik, Ressourcenschonung und Energieeffizienz (TREE)
Projects:WireLife - Lebensdauer neuer Aluminiumdrähte der Leistungselektronik (DE/BMBF/13FH544KX0)
Dewey Decimal Classification (DDC):6 Technik, Medizin, angewandte Wissenschaften / 67 Industrielle Fertigung / 671 Verfahren der Metallverarbeitung und Rohprodukte aus Metall
Entry in this database:2026/06/23
Licence (German):License LogoCreative Commons - CC BY - Namensnennung 4.0 International