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Testchip for high temperature superconductor passive devices

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Metadaten
Document Type:Conference Object
Language:English
Author:R. Dill, J. Otto, G. Riha, P. Russer, L. Schultz, G. Sölkner, A. A. Valenzuela, E. Wolfgang
Parent Title (English):IEEE International Digest on Microwave Symposium, Dallas, TX, USA, 8-10 May 1990
First Page:863
Last Page:866
DOI:https://doi.org/10.1109/MWSYM.1990.99715
Publisher:IEEE
Publication year:1990
Dewey Decimal Classification (DDC):6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 620 Ingenieurwissenschaften und zugeordnete Tätigkeiten
Entry in this database:2018/10/06