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Comparative analysis of US-American and German standard production planning and control systems

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Metadaten
Document Type:Conference Object
Language:English
Author:Martin Schotten, Alexandra Kees
Parent Title (English):INRIA/IEEE Symposium on Emerging Technologies and Factory Automation, Paris, France, 10-13 Oct. 1995
Volume:2
First Page:23
Last Page:31
ISBN:0-7803-2535-4
DOI:https://doi.org/10.1109/ETFA.1995.496642
Publisher:IEEE
Publication year:1995
Dewey Decimal Classification (DDC):6 Technik, Medizin, angewandte Wissenschaften / 65 Management, Öffentlichkeitsarbeit / 658 Allgemeines Management
Entry in this database:2015/05/13