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Robust methods for EMC-driven routing

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Metadaten
Document Type:Article
Language:English
Author:D. Theune, R. Thiele, W. John, T. Lengauer
Parent Title (English):IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume:13
Issue:11
First Page:1366
Last Page:1378
ISSN:0278-0070
DOI:https://doi.org/10.1109/43.329265
Publisher:IEEE
Publication year:1994
Departments, institutes and facilities:Institut für funktionale Gen-Analytik (IFGA)
Dewey Decimal Classification (DDC):0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 004 Datenverarbeitung; Informatik
Entry in this database:2015/09/29