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EMC-driven midway routing on PCBs

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Metadaten
Document Type:Conference Object
Language:English
Author:H. Schmidt, D. Theune, R. Thiele, T. Lengauer
Parent Title (English):Proceedings of the 1995 European conference on Design and Test, ED&TC 1995. Paris, France, 6-9 March 1995
First Page:486
Last Page:491
ISBN:0-8186-7039-8
DOI:https://doi.org/10.1109/EDTC.1995.470357
Publisher:IEEE
Publication year:1995
Departments, institutes and facilities:Institut für funktionale Gen-Analytik (IFGA)
Dewey Decimal Classification (DDC):0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 004 Datenverarbeitung; Informatik
Entry in this database:2015/09/29