Fracture mechanical life-time investigation of glass-frit bonded MEMS sensors
Document Type: | Conference Object |
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Language: | English |
Author: | M. Petzold, C. Dresbach, M. Ebert, J. Bagdahn, M. Wiemer, K. Glien, J. Graf, R. Muller-Fiedler, H. Hofer |
Parent Title (English): | Thermal and Thermomechanical Proceedings 10th Intersociety Conference on Phenomena in Electronics Systems, 2006. ITHERM 2006. 30 May - 02 June 2006, San Diego, CA, USA |
Number of pages: | 6 |
First Page: | 1343 |
Last Page: | 1348 |
ISBN: | 0-7803-9524-7 |
DOI: | https://doi.org/10.1109/ITHERM.2006.1645501 |
Publisher: | IEEE |
Date of first publication: | 2006/07/05 |
Keywords: | crack growth; fracture toughness; micro chevron; reliability |
Dewey Decimal Classification (DDC): | 6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 620 Ingenieurwissenschaften und zugeordnete Tätigkeiten |
Entry in this database: | 2022/04/14 |