Safety applications require fast, precise and highly reliable sensors at low costs. This paper presents signal processing methods for an active multispectral optical point sensor instrumentation for which a first technical implementation exists. Due to the very demanding requirements for safeguarding equipment, these processing methods are targeted to run on a small embedded system with a guaranteed reaction time T < 2 ms and a sufficiently low failure rate according to applicable safety standards, e.g., ISO-13849. The proposed data processing concept includes a novel technique for distance-aided fusion of multispectral data in order to compensate for displacement-related alteration of the measured signal. The distance measuring is based on triangulation with precise results even for low-resolution detectors, thus strengthening the practical applicability. Furthermore, standard components, such as support vector machines (SVMs), are used for reliable material classification. All methods have been evaluated for variants of the underlying sensor principle. Therefore, the results of the evaluation are independent of any specific hardware.
Recent studies point out that spoofing attacks using facial masks still are a severe problem for current biometric face recognition (FR) systems. As such systems are becoming more frequently used, for example, for automated border crossing or access control to critical infrastructure, advanced anti-spoofing techniques are necessary to counter these attacks. This work presents a novel, cross-modal approach that enhances existing solutions for face verification and uses multispectral short wave infrared (SWIR) imaging to ensure the authenticity of a face even in the presence of partial disguises and masks. It is evaluated on a dataset containing 137 subjects and a variety of spoofing attacks. Using a commercial FR system, it successfully rejects all attempts to counterfeit a foreign face with a false acceptance rate FARcf = 0% and most attempts to disguise the own identity with FARdg = 1% at a false rejection rate of FRR < 5% using SWIR images for verification.
The application of Raman and infrared (IR) microspectroscopy is leading to hyperspectral data containing complementary information concerning the molecular composition of a sample. The classification of hyperspectral data from the individual spectroscopic approaches is already state-of-the-art in several fields of research. However, more complex structured samples and difficult measuring conditions might affect the accuracy of classification results negatively and could make a successful classification of the sample components challenging. This contribution presents a comprehensive comparison in supervised pixel classification of hyperspectral microscopic images, proving that a combined approach of Raman and IR microspectroscopy has a high potential to improve classification rates by a meaningful extension of the feature space. It shows that the complementary information in spatially co-registered hyperspectral images of polymer samples can be accessed using different feature extraction methods and, once fused on the feature-level, is in general more accurately classifiable in a pattern recognition task than the corresponding classification results for data derived from the individual spectroscopic approaches.
This contribution investigates the application of established pansharpening algorithms for the fusion of hyperspectral images from Raman microspectroscopy and panchromatic images from conventional brightfield microscopy. Seven different methods based on multiresolution analysis and component substitution were applied and evaluated through visual assessment and quantitative quality measures at full and reduced resolution. The results indicate that, among the considered concepts, multiresolution methods are the more promising approaches for a physically and chemically meaningful fusion of the considered modalities. Here, pansharpening based on high-pass filtering led to the best results.
Design of an Active Multispectral SWIR Camera System for Skin Detection and Face Verification
(2016)
Biometric face recognition is becoming more frequently used in different application scenarios. However, spoofing attacks with facial disguises are still a serious problem for state of the art face recognition algorithms. This work proposes an approach to face verification based on spectral signatures of material surfaces in the short wave infrared (SWIR) range. They allow distinguishing authentic human skin reliably from other materials, independent of the skin type. We present the design of an active SWIR imaging system that acquires four-band multispectral image stacks in real-time. The system uses pulsed small band illumination, which allows for fast image acquisition and high spectral resolution and renders it widely independent of ambient light. After extracting the spectral signatures from the acquired images, detected faces can be verified or rejected by classifying the material as "skin" or "no-skin". The approach is extensively evaluated with respect to both acquisition and classification performance. In addition, we present a database containing RGB and multispectral SWIR face images, as well as spectrometer measurements of a variety of subjects, which is used to evaluate our approach and will be made available to the research community by the time this work is published.
