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Design of an Active Multispectral SWIR Camera System for Skin Detection and Face Verification
(2016)
Biometric face recognition is becoming more frequently used in different application scenarios. However, spoofing attacks with facial disguises are still a serious problem for state of the art face recognition algorithms. This work proposes an approach to face verification based on spectral signatures of material surfaces in the short wave infrared (SWIR) range. They allow distinguishing authentic human skin reliably from other materials, independent of the skin type. We present the design of an active SWIR imaging system that acquires four-band multispectral image stacks in real-time. The system uses pulsed small band illumination, which allows for fast image acquisition and high spectral resolution and renders it widely independent of ambient light. After extracting the spectral signatures from the acquired images, detected faces can be verified or rejected by classifying the material as "skin" or "no-skin". The approach is extensively evaluated with respect to both acquisition and classification performance. In addition, we present a database containing RGB and multispectral SWIR face images, as well as spectrometer measurements of a variety of subjects, which is used to evaluate our approach and will be made available to the research community by the time this work is published.
The application of Raman and infrared (IR) microspectroscopy is leading to hyperspectral data containing complementary information concerning the molecular composition of a sample. The classification of hyperspectral data from the individual spectroscopic approaches is already state-of-the-art in several fields of research. However, more complex structured samples and difficult measuring conditions might affect the accuracy of classification results negatively and could make a successful classification of the sample components challenging. This contribution presents a comprehensive comparison in supervised pixel classification of hyperspectral microscopic images, proving that a combined approach of Raman and IR microspectroscopy has a high potential to improve classification rates by a meaningful extension of the feature space. It shows that the complementary information in spatially co-registered hyperspectral images of polymer samples can be accessed using different feature extraction methods and, once fused on the feature-level, is in general more accurately classifiable in a pattern recognition task than the corresponding classification results for data derived from the individual spectroscopic approaches.