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Mechanical properties and microstructure of heavy aluminum bonding wires for power applications

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Metadaten
Document Type:Conference Object
Language:English
Author:C. Dresbach, M. Mittag, M. Petzold, E. Milke, T. Müller
Parent Title (English):2009 European Microelectronics and Packaging Conference, EMPC 2009, 15-18 June 2009, Rimini
ISBN:978-1-4244-4722-0
URL:https://ieeexplore.ieee.org/document/5272862
Publisher:IEEE
Date of first publication:2009/09/29
Keywords:EBSD; Hall-Petch relation; aluminum; indentation; micro compression test; wire bonding
Dewey Decimal Classification (DDC):6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 620 Ingenieurwissenschaften und zugeordnete Tätigkeiten
Entry in this database:2022/04/14